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The system for identification of crystalline materials of claim 1, wherein the energy dispersive X-ray detector has an active detector area of at least 100 mm 2.Ħ. The system for identification of crystalline materials of claim 1, wherein the energy dispersive X-ray detector is made from Si or Ge cooled to a low temperature or one or more compound semiconductors comprising CdTe, CdZnTe, HgI 2 and/or GaAs.ĥ. The system for identification of crystalline materials of claim 1, wherein the energy dispersive X-ray detector operates at or near −10° C. The system for identification of crystalline materials of claim 1, wherein the X-ray source is an air-cooled or oil-cooled tube operating at a power level of less than 1,000 Watts.ģ. an energy dispersive X-ray detector, wherein the symmetry axis extends from the center of the X-ray source to the center of the detector face.Ģ. one or more diffracted beam collimators, each having a plurality of annular diffraction slits, the diffracted beam collimators being concentric with and perpendicular to the system symmetry axis, wherein the diffracted slits only permit passage of diffracted X-ray beams that originate from a diffraction plane perpendicular to the system symmetry axis, wherein a portion of the incident X-ray beams interact with a test object to produce the diffracted X-ray beams, wherein the diffraction plane comprises vertices of a plurality of diffraction voxels, the diffraction voxels being formed where the incident X-ray beams and a projection of an acceptance angle intersect, the projection of said acceptance angle being formed by the diffracted X-ray beams angled to pass through the annular diffraction slits of the diffracted beam collimators and d. an incident beam collimator having a plurality of incident annular slits, each said incident annular slit having an apex, the incident beam collimator being aligned with and perpendicular to the system symmetry axis and each said incident annular slit having the X-ray source at its apex, wherein each said incident annular slit only permits passage of incident X-ray beams c. an X-ray source having a center aligned with the system symmetry axis, the X-ray source emitting a polychromatic X-ray beam b. A system for identification of crystalline materials having a symmetry axis extending from the center of the X-ray source to the center of the detector face, comprising: a.